List of materials analysis methods

Analytical ultracentrifuge forces analysis ultracentrifugation.
The ARPES – angle resolved photoemission spectroscopy.
AES – auger electron spectroscopy.
APFIM – Atom probe field ion microscopy.
APS – appearance potential spectroscopy.
AAS – atomic absorption spectroscopy.
AFS – atomic fluorescence spectroscopy.
ATR – attenuated total internal reflection.
AFM – atomic force microscopy.
AED – auger electron diffraction.
ARUPS – angle resolved ultraviolet photoemission spectroscopy.

1. B
BiFC – Bimolecular fluorescence complementation.
Fucking Amateurs – back scattered electron diffraction, see Dore.
Bet – bet surface area measurement.
BKD – backscatter Kikuchi diffraction, see Dore.
Bret – resonance energy transfer bioluminescence.

2. With
Cryo-EM – cryo-electron microscopy.
CE – capillary electrophoresis.
Cars – coherent anti-Stokes Raman spectroscopy.
Scattering CAICISS coaxial impact ion spectroscopy.
CDI – coherent diffraction imaging.
CV – cyclic voltammetry.
CBED – convergent beam electron diffraction.
Cryo-SEM – cryo-electron microscopy.
CCM – charge collection microscopy.
LSCM – laser scanning confocal microscopy.
Cosy – correlation spectroscopy.
CL – Cathodoluminescence. (КЛ – Катодолюминесценция)
CHP – cryo-electron tomography.

3. D
DVS – dynamic vapor sorption.
Dielectric spectroscopy – dielectric spectroscopy.
DHvA – de Haas–van Alphen effect.
DTA – differential thermal analysis.
DSC – differential scanning calorimetry.
DRS – spectroscopy of diffuse reflection.
DIC – differential interference contrast microscopy.
DLS – dynamic light scattering.
DETA – dielectric thermal analysis.
DMA – dynamic mechanical analysis.
Dpi dual polarization interferometry.
DLTS – deep-level transient spectroscopy.

4. E
EPR – electron paramagnetic resonance spectroscopy.
EFTEM – the transmission of energy filtered electron microscopy.
EDS or edX – energy dispersive x-ray spectroscopy.
Dore – electron backscatter diffraction.
E – Electroluminescence. (Эл – Электролюминесценция)
EIT and ERT – electrical impedance tomography and electrical resistivity tomography.
Endor – electron nuclear double resonance, see ESR or EPR.
EBIC – electron beam induced current and see IBIC: ion beam induced charge.
Adria – Energy-dispersive analysis of x-rays.
ESEM – environmental scanning electron microscopy.
Erma – electronic-probe microanalysis.
Electron crystallography – Electron crystallography.
By exafs – extended x-ray absorption fine structure.
ECOSY – exclusive correlation spectroscopy.
ESI-MS and ISP-MS with Electrospray mass spectrometry or mass spectrometry Electrospray.
EPR – electron paramagnetic resonance spectroscopy.
ELS Electrophoretic light scattering.
EBS – elastic non-rezerfordovskogo spectrometry backscattering RBS, see.
ECT – electrical capacitance tomography.
ESD – electron stimulated desorption.
Of ESTM – electrochemical scanning tunneling microscopy.
EDMR – electrically detected magnetic resonance, see ESR or EPR.
ERD or Erda – elastic recoil detection or elastic recoil analysis.
EXSY – exchange spectroscopy.
ESCA. electron spectroscopy for chemical analysis* see EPS.
Acne – loss spectroscopy electron energy.
EID – Electron desorption induced.

5. F
Ksts – fluorescence cross-correlation spectroscopy.
FIB – focused ion beam microscopy.
FTICR or FT-MS – Fourier or mass spectrometry ion cyclotron resonance Fourier transform.
FRS forward recoil spectrometry, a synonym of ERD.
FOSPM – feature-oriented scanning probe microscopy.
Fluorescence anisotropy fluorescence anisotropy.
Fourier transform infrared spectroscopy with Fourier transform.
Fluorescence microscopy – Fluorescence microscopy.
FEM – field emission microscopy.
Fret – fluorescence resonance energy transfer.
Birefringence flow birefringence flow.
FLIM – fluorescence lifetime imaging.
FIM-AP field ion microscopy–atom probe.
FCS – fluorescence correlation spectroscopy.

6. G
GISAXS – moving small-angle x-ray scattering.
GC-MS – gas chromatography-mass spectrometry.
GUO – glow discharge optical spectroscopy.
GLC – gas-liquid chromatography.
GDMS – glow discharge mass spectrometry.
GIXR – moving x-ray reflectometry.
GIXD – grazing incidence at x-ray diffraction.

7. H
Hi-Erda – heavy ion elastic recoil detection analysis.
Has – helium atom scattering.
HREM – high resolution electron microscopy.
HREELS – high-resolution spectroscopy of energy losses of electrons.
HAADF – high angle annular dark field image.
It-again – high energy protons x-ray radiation.
HREM – high-resolution transmission electron microscopy.
HPLC – high performance liquid chromatography.

8. I
IBIC – ion beam induced charge microscopy.
Of IETS – inelastic electronic tunneling spectroscopy.
AES-ICP – inductively coupled plasma atomic emission spectroscopy.
IGF – fusion inert gas.
IBA – ion beam analysis.
H ions by x-ray analysis: see particle induced x-ray emission.
ITC – isothermal titration calorimetry.
ICR – ion cyclotron resonance.
IVEM medium voltage electron microscopy.
Ins – scattering Ion neutralization spectroscopy inelastic neutron.
Immunofluorescence – Immunofluorescence. (Иммунофлюоресценция – Иммунофлюоресценция)
IgA – intelligent gravimetric analysis.
ISS – spectroscopy ion scattering.
IPEA ions by auger-electron spectroscopy.
IRS – infrared spectroscopy.
ICP-MS inductively coupled plasma mass spectrometry.
IRNDT – infrared non-destructive testing of materials.

9. L
LOES – laser optical emission spectroscopy.
Leis – low energy ion scattering.
LEED – low energy electron diffraction.
LC-MS – liquid chromatography-mass spectrometry.
LS – light Raman scattering.
LALLS – low angle laser scattering light.
LEU – low-energy electron microscopy.
Library breakdown Laser induced breakdown spectroscopy.

10. M
MPM – Multiphoton fluorescence microscopy.
MS – mass spectrometry.
MS / MS – tandem mass spectrometry.
Mossbauer spectroscopy, Mossbauer spectroscopy.
MSGE – mechanically stimulated gas emission.
MALDI – matrix-activated laser desorption / ionization.
MIT magnetic induction tomography.
MRI – magnetic resonance imaging.
MBE – molecular beam epitaxy.
MFM magnetic force microscopy.
MRFM – magnetic resonance force microscopy.
MTA – analysis Microthermal.
Meis – medium energy ion scattering.

11. N
NEXAFS – near edge x-ray absorption fine structure.
IBRO has – near-field optical microscopy.
NOESY spectroscopy the nuclear Overhauser effect.
Nanovid microscopy – microscopy, Nanovid.
NAA – neutron activation analysis.
NIS – nuclear inelastic scattering / absorption.
ND – neutron diffraction.
NDP – neutron depth profiling.
NRA – nuclear reaction analysis.
NMR spectroscopy nuclear magnetic resonance.

12. On
OES – optical emission spectroscopy.
ODNMR – optically detected magnetic resonance, see ESR or EPR.
OBIC – optical beam induced current.
Methods Of Osmometry Methods Of Osmometry.

13. P
Photoacoustic spectroscopy – Photoacoustic spectroscopy.
PTS – Photothermal spectroscopy.
PET agreement – Photoacoustic imaging, or photoacoustic tomography.
Parametrom. (Параметром)
PINEM – photon-induced near-field microscopy.
X-particles or protons, x-ray spectroscopy.
Powder diffraction – diffraction.
FES – Photoelectron spectroscopy.
PD – quantum yields of photodesorption.
Girl – particles or protons, gamma spectroscopy, see nuclear reaction analysis.
PDEIS – Potentiodynamic electrochemical impedance spectroscopy.
PAX – photoemission of adsorbed xenon.
PDS – photothermal deflection spectroscopy.
PED – photoelectron diffraction.
PAS – positron annihilation spectroscopy.
Or PC spectroscopy of photocurrent.
Peels – parallel spectroscopy electron energy loss.
FL – photoluminescence. (ФЛ – фотолюминесценция)
PEEM – Photoemission electron microscopy and photoelectron emission microscopy.
Candidate photoelectron diffraction. (Кандидат фотоэлектронной дифракции)
Phase contrast microscopy – phase contrast microscopy.
PTMS – Photothermal Microspectroscopy.

14. R
The RIXS – resonant inelastic x-ray scattering.
Raman – Raman spectroscopy.
Rims – resonance ionization mass spectrometry.
Rubles spectroscopy – resonance Raman spectroscopy.
RDS – the difference in reflectivity spectroscopy.
REM – the reflection electron microscopy.
RBS spectrometry rezerfordovskogo backscatter.
RHEED diffraction of fast electrons on reflection.
RAXRS – resonant anomalous x-ray scattering.

15. With
Of SERS – surface enhanced Raman spectroscopy.
SNOM – scanning near-field optical microscopy.
SIL – solid immersion lens.
SEM – scanning electron microscopy.
Sted – stimulated emission depletion microscopy.
Sec – size exclusion chromatography.
Sims – secondary ion mass spectrometry.
SPM – scanning probe microscopy.
Scem is a scanning confocal microscopy.
STM – scanning tunneling microscopy.
Sad – selected area diffraction.
Stark spectroscopy stark spectroscopy.
SEIRA – surface enhanced infrared absorption spectroscopy.
SNMS – sputtered neutral species mass spectroscopy.
Sans – small-angle scattering in.
The Saed – selected area electron diffraction.
STS – scanning tunneling spectroscopy.
Sam – scanning auger microscopy.
SIM – solid immersion mirror.
SEXAFS – surface extended x-ray absorption fine structure.
SAXS – small angle x-ray scattering.
Stem – scanning transmission electron microscopy.
SERRS – surface enhanced resonance Raman spectroscopy.
SRM-CE / MS – selected-reaction-monitoring capillary-electrophoresis and mass spectrometry.
SE – spectroscopic ellipsometry.
SXRD – surface x-ray diffraction SXRD.
SPECT – single photon emission computed tomography.
SSNMR solid state nuclear magnetic resonance.
SCANIIR – the composition of the surface by analysis of neutral species and ion-impact radiation.
SESANS – spin-Echo small-angle neutron scattering.
SICM – scanning ion conductance microscopy.

16. T
TMA – Thermomechanical analysis.
Two-photon excitation microscopy two-photon excitation microscopy.
TAT or tact – Thermoacoustic tomography or thermoacoustic computed tomography see Also photoacoustic tomography – PET.
TEM – transmission electron microscope / microscopy.
TOF-MS – time-of-flight mass spectrometry.
TIRFM – total internal reflection fluorescence microscopy.
TGA – Thermogravimetric analysis.
Tims – thermal ionization mass spectrometry.
TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy.
TXRF – total reflection x-ray fluorescence analysis.
Teak – transmitting ion kinetic analysis.

17. Have. (Есть)
UPS – UV photoelectron spectroscopy.
Attenuation spectroscopy, ultrasonic spectroscopy ultrasound attenuation.
USAXS ultra – small angle x-ray scattering.
UV, visible, and ultraviolet–visible spectroscopy.
USANS scattering ultra small angle neutron scattering.
Ultrasonic inspection – ultrasonic inspection.

18. X
XRS – x-ray Raman scattering.
Data of x-ray standing wave technique.
XRR – x-ray reflectometry.
Hush – x-ray absorption spectroscopy.
X-ray analysis – x-ray crystallography.
Analysis Xrd – x-ray diffraction.
X Suu – x-ray crystal truncation rod scattering.
XPS – x-ray photoelectron spectroscopy.
XANES synonymous with NEXAFS near edge x-ray absorption fine structure.
XPEEM – x-ray photoelectron emission microscopy.
XDС – x-ray diffuse scattering.
XRES – x-ray resonant exchange scattering.
XAES x – ray-induced auger-electron spectroscopy.
XRF x – ray fluorescence analysis.

A list of chemical analysis methods with acronyms. Top A B C D E F G H I J K L M N O P Q R S T U V W X Y Z See also Atomic absorption spectroscopy AAS
Acronyms in microscopy List of materials analysis methods List of materials - testing resources Failure mode and effects analysis FMEA Failure rate Forensic
Material flow analysis MFA also referred to as substance flow analysis SFA is an analytical method to quantify flows and stocks of materials or substances
interdisciplinary field of materials science, also commonly termed materials science and engineering, is the design and discovery of new materials particularly
stability analysis tools use various versions of the methods of slices such as Bishop simplified, Ordinary method of slices Swedish circle method Petterson Fellenius
iterative methods are generally needed for large problems. Iterative methods are more common than direct methods in numerical analysis Some methods are direct
element method Interval finite element Isogeometric analysis Lattice Boltzmann methods List of finite element software packages Meshfree methods Movable
International. p. 9. List of ASTM test methods for sieve analysis of various materials ASTM C136 C136M - 14 Standard Test Method for Sieve Analysis of Fine and
chemistry List of chemical analysis methods List of materials analysis methods Measurement uncertainty Metrology Sensory analysis - in the field of Food science
The dynamic design analysis method DDAM is a US Navy - developed analytical procedure for evaluating the design of equipment subject to dynamic loading
on how this error is perceived. Existing methods for meta - analysis yield a weighted average from the results of the individual studies, and what differs
statistical methods or use qualitative methods to analyse meanings of content within texts. Computers are increasingly used in content analysis to automate
for a small range of tasks, however there still aren t any known methods of image analysis that are generic enough for wide ranges of tasks, compared to

Data analysis is a process of inspecting, cleansing, transforming and modeling data with the goal of discovering useful information, informing conclusion
Stress strain analysis or stress analysis is an engineering discipline that uses many methods to determine the stresses and strains in materials and structures
Structured Systems Analysis and Design Method SSADM originally released as methodology, is a systems approach to the analysis and design of information systems
Failure mode and effects analysis FMEA often written with failure modes in plural is the process of reviewing as many components, assemblies, and
This is a list of numerical analysis topics. Validated numerics Iterative method Rate of convergence - the speed at which a convergent sequence approaches
Besides the power analysis there are less formal methods for selecting the number of experimental units. These include graphical methods based on limiting
Spatial analysis or spatial statistics includes any of the formal techniques which studies entities using their topological, geometric, or geographic properties
In the field of numerical analysis meshfree methods are those that do not require connection between nodes of the simulation domain, i.e. a mesh, but
the materials most researchers mean when they say reference materials An example of a reference material is USGS - 34, a KNO3 salt with a δ15N of - 1.8